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Jiadong Dan

πŸ€– Eric and Wendy Schmidt AI in Science Fellow
πŸŽ“ National University of Singapore, πŸ‡ΈπŸ‡¬
πŸ“ Office: 14, Science Drive 4, CBIS, NUS

Welcome πŸ‘‹

I am an Eric and Wendy Schmidt AI in Science Fellow at the National University of Singapore (NUS), specializing in the intersection of machine learning (ML) and scanning transmission electron microscopy (STEM). Guided by Prof. Stephen J. Pennycook, my Ph.D. research innovatively applied ML to identify quantum defects in atomic resolution STEM images. Now in Assoc. Prof. Duane Loh’s group, I am advancing a robust ML framework to characterize materials through a hierarchy of structural motifs. Leveraging my deep expertise, I aim to develop an electron microscope copilot system to improve material analysis and enhance understanding of material disorders.

What is Scanning Transmission Electron Microscopy?

Scanning Transmission Electron Microscopy (STEM) is an advanced material characterization technique that uses a focused electron beam to scan thin samples, producing atomic-resolution images. Besides imaging, STEM can collect spectral data to analyze material compositions and perform four-dimensional scanning transmission electron microscopy (4DSTEM), which captures diffraction patterns at each scan position.