defects

Atomically engineering metal vacancies in monolayer transition metal dichalcogenides

Scanning probe microscopy and scanning transmission electron microscopy (STEM) are powerful tools to trigger atomic-scale motions, …

Xiaocang Han, Mengmeng Niu, Yan Luo, Runlai Li, Jiadong Dan, Yanhui Hong, Xu Wu, Alex V Trukhanov, Wei Ji, Yeliang Wang, Jiahuan Zhou, Jingsi Qiao, Jin Zhang, Xiaoxu Zhao