features

Can Conventional Classifiers Outperform Neural Networks in Identifying Structural Defects from Atomic Resolution Micrographs?
The identification of structural defects in materials through atomic resolution scanning transmission electron microscopy (STEM) images …
Jiadong Dan , Cheng Zhang, N. Duane Loh
Cite HTML
Symmetry quantification and segmentation in STEM imaging through Zernike moments
We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning transmission electron …
Jiadong Dan , Cheng Zhang, Xiaoxu Zhao, N. Duane Loh
PDF Cite Code Poster HTML
defect-learn
⚛️Deep learning point defects in two-dimensional materials. 🔒[private]
May 22, 2024
defect-learn
motif-learn
🔬machine learning in scanning transmission electron microscopy.
May 21, 2024
motif-learn