STEM

Can Conventional Classifiers Outperform Neural Networks in Identifying Structural Defects from Atomic Resolution Micrographs?
The identification of structural defects in materials through atomic resolution scanning transmission electron microscopy (STEM) images …
Jiadong Dan , Cheng Zhang, N. Duane Loh
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Symmetry quantification and segmentation in STEM imaging through Zernike moments
We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning transmission electron …
Jiadong Dan , Cheng Zhang, Xiaoxu Zhao, N. Duane Loh
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Exploring motifs and their hierarchies in crystals via unsupervised learning
Jiadong Dan , Xiaoxu Zhao, Qian He, N. Duane Loh, Stephen J. Pennycook
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Navigating the nanoworld: automatic feature recognition
Stephen J. Pennycook, Jiadong Dan, Xiaoxu Zhao, Shoucong Ning, Wu Zhou, Qian He, N. Duane Loh
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Learning motifs and their hierarchies in atomic resolution microscopy
Jiadong Dan, Xiaoxu Zhao, Shoucong Ning, Jiong Lu, Kian Ping Loh, Qian He, N. Duane Loh , Stephen J. Pennycook
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A machine perspective of atomic defects in scanning transmission electron microscopy
Enabled by the advances in aberration-corrected scanning transmission electron microscopy (STEM), atomic-resolution real space imaging …
Jiadong Dan, Xiaoxu Zhao, Stephen J. Pennycook
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Effects of precursor pre-treatment on the vapor deposition of WS$_2$ monolayers
Mei Er Pam, Yumeng Shi, Junping Hu, Xiaoxu Zhao, Jiadong Dan, Xue Gong, Shaozhuan Huang, Dechao Geng, Stephen Pennycook, Lay Kee Ang, Hui Ying Yang
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