symmetry

Can Conventional Classifiers Outperform Neural Networks in Identifying Structural Defects from Atomic Resolution Micrographs?
The identification of structural defects in materials through atomic resolution scanning transmission electron microscopy (STEM) images …
Jiadong Dan , Cheng Zhang, N. Duane Loh
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Symmetry quantification and segmentation in STEM imaging through Zernike moments
We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning transmission electron …
Jiadong Dan , Cheng Zhang, Xiaoxu Zhao, N. Duane Loh
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